IEEE Transactions on Device and Materials Reliability

1.6(top 50%)

impact factor

2.2K(top 10%)

papers

33.7K(top 10%)

citations

75(top 10%)

h-index

1.6(top 50%)

extended IF

2.4K

all documents

34.8K

doc citations

122(top 10%)

g-index

Top Authors (by article citations)

#	Author	Articles	Citations	R ARank	R CRank
1	Uwe Schroeder	1	176	1	1
1	Thomas Mikolajick	1	176	4	1
1	Johannes Müller	1	176	1	2
1	Stefan Mueller	1	176	1	1
5	Christopher Mark Johnson	1	130	1	1
6	John H L Pang	1	80	1	1
7	Simoen Eddy	1	70	3	2
7	Cor Claeys	1	70	2	1
7	Guy Brammertz	1	70	2	2
7	Clement Merckling	1	70	2	1
11	Karabi Biswas	1	67	1	2
11	Debasmita Mondal	1	67	1	1
13	Pengcheng Huang	1	52	1	1
13	Jianjun Chen	1	52	1	1
15	Robert M Wallace	1	43	5	6
15	Barry Brennan	1	43	3	4
15	Karim Cherkaoui	1	43	3	3
15	Ian M Povey	1	43	2	2
15	Scott Monaghan	1	43	3	2
15	Vladimir Djara	1	43	1	1
15	Eamon O'connor	1	43	1	2
23	Nicola Trivellin	1	40	2	1
23	Gaudenzio Meneghesso	4	115	3	3
23	Matteo Meneghini	4	115	2	3
26	Xin Li	1	39	1	4
26	Yun-Hui Mei	1	39	2	4
26	Xu Chen	1	39	3	6
26	Guo-Quan Lu	1	39	2	3
30	Sachin S Sapatnekar	1	31	1	1
31	Tetsuji Yasuda	1	25	1	6
31	David J Smith	1	25	6	9
31	Tatsuro Maeda	1	25	1	3
31	Wipakorn Jevasuwan	1	25	1	3
31	Adrianagrazia Passaseo	1	25	1	1
31	SangHyeon Kim	1	25	2	5
31	David A Cullen	1	25	1	4
31	Takuya Hoshii	1	25	1	3
31	Vittorianna Tasco	1	25	1	1
31	Shinichi Takagi	1	25	4	7
31	Mitsuru Takenaka	1	25	3	5
31	Noriyuki Taoka	1	25	5	5
43	Michael G Pecht	2	34	3	13
44	Mohammad M Hamasha	1	22	1	1
44	Chien-Yi Peng	1	22	1	1
44	Susan Lu	1	22	1	1
47	Tibor Grasser	1	20	4	3
47	Praveen K C	1	20	1	1
47	Dinakar Kanjilal	1	20	8	8
47	Ben Kaczer	2	20	4	3
47	Jacopo Franco	1	20	2	3
47	Guido Groeseneken	2	31	6	7
53	Sonam Rewari	2	27	2	2
53	Hyunsik Im	1	19	2	3
53	Mridula Gupta	2	27	2	3
53	Manoj Saxena	1	19	4	5
53	Hee-Dong Kim	1	19	3	4
53	Rajni Gautam	1	19	1	1
59	Xiao Gong	1	18	2	4
59	Yee-Chia Yeo	1	18	4	7
62	Yu Cao	1	17	2	4
63	Farid Medjdoub	1	16	1	1
64	Peide D Ye	2	30	2	3
64	Mengwei Si	1	15	1	3
64	Guangfan Jiao	1	15	1	1
64	Muhammad Masuduzzaman	1	15	1	1
64	Jiangjiang Gu	1	15	1	1
69	Xiao Sun	1	14	2	2
70	Zhaonian Yang	1	12	1	1
70	Chao Zhang	1	12	8	7
70	Hong-Xia Liu	1	12	1	1
74	Shinji Yokogawa	1	11	2	1
75	Michael H Azarian	1	10	1	3
75	Hyunseok Oh	1	10	1	1
77	Stewart E Rauch	1	8	1	1
77	Ujjwal Ghanta	1	8	1	1
77	Mallar Ray	1	8	2	2
77	Hossein Asadi	1	8	1	2
77	Mahdi Fazeli	1	8	1	3
77	Arpita Jana	1	8	1	2
77	Syed Minhaz Hossain	1	8	1	1
77	Seyed Ghassem Miremadi	1	8	1	2
77	Nil Ratan Bandyopadhyay	1	8	1	2
77	Monika Bhattacharya	1	8	1	1
77	Jyotika Jogi	1	8	1	1
88	Esteve Amat	2	11	1	2
88	Carmen G Almudever	2	11	1	1
88	José Antonio Rubio Sola	2	11	1	1
88	Ramon Canal Corretger	2	11	1	2
92	Christian Monzio Compagnoni	1	6	3	3
92	Alessandro Sottocornola Spinelli	1	6	3	3
92	Andrea L Lacaita	1	6	5	6
92	Carmine Miccoli	1	6	1	1
96	Jung-Hua Chou	1	5	1	1
96	H-C Tseng	1	5	2	1
96	Remko Akkerman	1	5	3	6
99	Chao-Ming Lin	1	4	1	1
99	Pedro Reviriego	1	4	3	9
99	Juan Antonio Maestro	1	4	3	8
99	Salvatore Pontarelli	1	4	3	5
99	Noureddine Sengouga	1	4	1	2
99	Marco Ottavi	1	4	1	4
99	Chun-Yu Lin	1	4	1	3
99	Ming-Dou Ker	1	4	2	5
99	Sabata Moloi	1	4	1	1
109	Cristiano Palego	1	3	1	2
109	David Molinero	1	3	1	2
109	Chao Shen	1	3	1	1
112	Chao-Sung Lai	3	2	1	13
112	Cher-Ming Tan	1	2	2	3
112	M M Malik	1	2	1	5
115	James H Stathis	1	0	1	3
115	Felice Crupi	1	0	1	6
115	Chia-Ming Yang	2	0	2	4

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IEEE Transactions on Device and Materials Reliability

Top Authors (by article citations)